Precise 3D Measurement Camera For Any Microscope
  • ZeeCam

  • ZeeCam

  • ZeeCam

Hardware:
ZeeCam features the most advanced properties for fast and precise 3D acquisition. Instead of using traditional motorized means such as stepper motors or piezo devices, ZeeCam uses a proprietary PhaseView optical assembly for 3D scanning, integrating the latest advances of digital lens technology for accurate and highly repeatable 3D acquisition and surface metrology

Software:
ZeeCam is supplied with GUI software GetPhase. An optional API/ SDK is provided for microscopy automated systems with comprehensive 3D acquisition tools.

ZeeCam 100 ZeeCam 150 ZeeCam 200
Camera CMOS 1280 x 1024 5.2?m
square pixels
30fps@full resolution
CCD 1616 x 1216
4.40 square pixels
12fps@full resolution
CCD 2560 x 1920
2.20 square pixels
6fps@full resolution
Microscope interface video Port – C-mount, recommended 1x c-mount coupler
Dimensions & weight
ZeeCam Head
Control unit
155(H) 80(W) 56(D) mm 375 g
40(H) 158(W) 150(D) mm 150g
Power supply 110/220V AC
PC interface USB 2.0

3D Measurement Performance

Z range and resolution are objective and c-mount coupler magnification dependant. The table here under gives typical performance for standard objective magnification with 1X coupler. For any other magnification and c-mount coupler configuration, the following formulas can be applied:

Z Range = 16mm / ( G_Obj * G_adapt)2
Z Resolution = Objective Depth Of Field /4
G_Obg = Objective magnification G_adapt = c-mount coupler magnification

Objective
Mag : NA
Z Range (?m) Z Resolution (?m)
5X / 0.10 640 0.32
10X / 0.25 160 0.08
20X / 0.45 40 0.02
50X / 0.8 6.4 0.003

Z accuracy: 1%
Z Repeatability: 0.35%
Max slope: 90°
XY Spatial resolution determined by camera resolution and objective magnification

Roughness Measurement

12 analysis parameters are provided in total, including the frequently-used Ra (Sa), Rq (Sq), Rz (Sz), parameters. Parameters conform to ISO 4287, 25178 DIN 4768

Measuring range: Ra, Rq: 0.01-500µm Measuring accuracy: ?±10% Repeatability: Less than or equal to 6%

Field Of View – Lateral XY resolution – Depth of Field

Field of View (FOV) = (Camera (H/V) resolution * camera pixel (H/V) / (G_Obj * G_adapt)
Depth of Field (DOF) = lambda / NA + pixelsize / (NA? * G_Obj * G_adapt)

G_Obj = objective magnification
G_adapt = c-mount coupler magnification
Lambda = typically 0.633?m
NA = objective numerical aperture
Pixelsize = camera pixel size

Z Calibration , Certification & System Calibration

Calibration for the Z axis is performed in Phaseview factory before shipment, using step height certified calibration standard. Checking Z calibration can be easily achieved using step height calibration standard such as Rubert satndard item number 513C (optional)

A system calibration software (see software specifications) is provided for XY calibration according to objective magnification and calculation of corrected XY shift parameters to be applied along the Z axis (Z-stack). The calibration data are then stored in an internal memory of the acquisition system. Typical accessories required for the calibration (optional).

3d1

Overview

ZeeCam is supplied with the Graphics User Interface « GetPhase « and a System Calibration software. An optional API / SDK is provided for integration purpose. All software are XP, Vista, 7, 8 (32 / 64 bit) compatible, and Graphics Processor Units (GPU) compatible.

GetPhase GUI (included)

Main features:
2D / 3D acquisition modes: 2D, Z-stack, 3D roughness, 3D Shape
Multiple display modes : 3D, Phase, DIC, Darkfield, Image fusion (Extended Depth of Field)
2D / 3D analysis tools : profiles, step height, roughness, etc.
Report & Export Data

GetPhase includes 3 different methods for Z axis and 3D acquisition:

Z Height measurement / Z-Stacking: relies on the unique Z-scanning capability of the PhaseView optical assembly providing accurate and repeatable Z steps.

3D Roughness Measurement: relies on proprietary wavefront technique, for measuring surface topography in reflection. The algorithm processes a set of 2 or more images acquired within objective depth of field. This method is particularly useful for measuring small surface variations, when sample features are all in-focus, within depth of fiel of the selected objective. The 3D reconstruction is determined by the maximum slope constraint; samples with steep slopes require high objective magnification as related to objective numerical aperture (NA).

3D Shape Measurement: relies on detecting local contrast on Z image series for measuring depth map of an object. The algorithm processes Z-stack images acquired beyond the objective depth of field. This method is well adapted to samples having surface variations beyond objective depth of field. 3D reconstruction is performed when samples exhibit some texture along the Z image planes.

System_Calibration software (Included)

Main features:
XY calibration for each objective magnification
Z-stack alignment parameters calculation
Calibration data are stored in acquisition system memory

API / SDK (Optional)

An optional API/ SDK is provided for microscopy automated systems with comprehensive 3D acquisition tools.

PDF 1.9Mb
Download PDF
Applications include:
  • Laser Marking Drilling Engraving
  • Failure analysis
  • Aeronautics
  • Automotive Industries
  • Tribology
  • Metal Tooling
  • QC Maintenance
  • Metal, Paint & Coatings, Ceramic, Polymers
  • Semiconductor Materials
  • Gemology,
  • Museum
  • Forensics
  • Education
The Easiest and Fastest Way to 3D imaging