Advanced 3D Microscopy & Scientific Imaging
Life Science
Industrial & Material Microscopy
Wavefront Analysis & Beam Profiling

BeamWave


BeamWave

The BeamWave sensors deliver intensity and wavefront measurements simultaneously in an all-in-one device. Instead of using microlens array for wavefront sampling, these sensors are based on Digital Wavefront Technology ®, hence the number of wavefront measurement points is only limited  by camera resolution providing a high spatial resolution wavefront,

These sensors are typically used for either simultaneous laser beam profiling and beam propagation analysis or high resolution wavefront measurement for optical elements characterization.

BeamWave sensors come with GetLase® GUI software for Instant diagnostic of all laser beam parameters and GetWave ® GUI software with comprehensive wavefront analysis tools including, Zernike, MTF and PSF.

Sucessfully used for applications such as:

Real Time Laser Beam Monitoring

Instant Laser Beam Diagnostic

Laser Diodes, fiber Lasers, semiconductors Lasers

Solid state lasers, lasers Telecom assemblies

Optics characterization : microlenses and ophthalmic lenses

 

SIMULTANEOUS INTENSITY AND WAVEFRONT ANALYSIS

High resolution intensity and wavefront provided by Digital Wavefront Technology®

HIGH RESOLUTION WAVEFRONT MEASUREMENT

Spatial wavefront mapping only limited by camera resolution, no microlens array sampling

ALL IN ONE DEVICE FOR BEAM MONITORING

Beam profiling including intensity distribution and beam propagation parameters in a single device

Wavelength range, nm
BeamWave-500 -1000 -1500 : 350-1100
BeamWave-FIR : 2000-16000
Maximum Input Beam Diameter, mm
BeamWave-500 : 4.8
BeamWave-1000 -1500 : 6.4
BeamWave-FIR: 8
Pixels
BeamWave-500 -1000 -1500 : 1392 x 1040
BeamWave-FIR: 640 x 480
Wavefront Measurement Points / lateral resolution
BeamWave-500 : 500 x 500, / 6.45µm
BeamWave-1000 -1500 : 1000 x 1000 / 6.45µm
BeamWave-FIR : 640 x 480 / 17µm
Wavefront sensitivity @ λ = 633 nm
BeamWave-500 : λ/200
BeamWave-1000 : λ/200
BeamWave-1500 : Flexible

Wavefront accuracy @ λ = 633 nm
BeamWave-500 : λ/100
BeamWave-1000 : λ/100
BeamWave-1500 : λ/100
Wavefront dynamic @ λ = 633 nm
BeamWave-500 : λ/100
BeamWave-1000 : λ/100
BeamWave-1000 : Flexible

Supplied with GetLase ® and GetWave ® GUI software includes comprehensive  measuring tools for beam profiling and wavefront analysis:

Intensity & wavefront acquisition

Live display 2D and 3D intensity, wavefront, PSF

Zernike Analysis, low and high order aberrations, astigmatism, etc.

Intensity distribution, XY profile, centroid, divergence angle etc.

Beam propagation analysis

Data export & report